• Sampath Kumar

      Articles written in Sadhana

    • Design, fabrication and performance evaluation of a 22-channel direct reading atomic emission spectrometer using inductively coupled plasma as a source of excitation

      R P Shukla S S Bhattacharya D V Udupa T Jayasekharan P P Khanna S M Marathe Sampath Kumar M N Patil S V G Ravindranath Sandeep Guha M B Guhagarkar A P Roy

      More Details Abstract Fulltext PDF

      The indigenous design, fabrication and performance evaluation of a polychromator, using inductively coupled plasma (ICP) as a source of excitation, are described. A concave holographic grating is used as the dispersing element and a Paschen — Runge mount is chosen to focus the spectra over a wide range along the Rowland circle. Twenty-two exit slits, mounted along the circle, precisely correspond to the wavelengths used for determination of up to twenty elements present in the plasma. Radiations emerging from the exit slits are detected by photomultiplier tubes placed behind them. The photomultiplier signal is recorded by an electronic system consisting of an integrator and a PC-based data acquisition system. The performance of the spectrometer has been evaluated with an ICP excitation source. Synthetic standards in deionized water containing a mixture of twenty impurities have been analysed. Typical determination limits observed for elements range from sub-ppm to ppm levels. All the elements present as impurities can be detected simultaneously. It is also observed that each element has a different emitting region in the ICP flame for which the maximum signal to the background is obtained. The determination limits obtained corresponding to these zones are the lowest. A study of the sensitive emitting zones for several elements has been carried out and the results are demonstrated by photographs of the ICP flame. The study will help in achieving the minimum value of determination limit for an impurity element.

    • Dual flexible rotor system with active magnetic bearings for unbalance and coupling misalignment faults analysis


      More Details Abstract Fulltext PDF

      Rotating machines are the backbone of the present industrial world. Early fault detection and conditioning of these machines are primary concern of the researchers associated in this field. There are various faults (assembly error, coupling misalignment, looseness, imbalance, rotor crack, etc.) that cause malfunction of rotating machinery. Imbalance is one of the oldest problem and still challenging to perfectly balance the rotor. Imbalance leads to another inherent fault, i.e., coupling misalignment, especially in dual rotor or rotor trainsystem. Imbalance and misalignment cause excessive vibration in the system that tends to shatter failure of the critical components of rotating machinery. In this article, active magnetic bearings (AMBs) are utilized to suppress the excessive vibration generated due to imbalance and misalignment. To regulate the controllingcurrent of AMB a proportional integral derivative (PID) feedback controller is employed. A quantification technique is suggested to evaluate the tuned AMB characteristics along with imbalance and coupling misalignment dynamic parameters. A finite element method (FEM) modelling with high-frequency reduction scheme is utilized to acquire reduced system equations of motion. There are two advantages of employing condensation scheme, first, it reduces the number of sensors required and second, only linear (practicallymeasurable) degrees of freedom are present in equations of motion derived. A SIMULINKTM code is prepared to solve a reduced linear differential equation. The time series feedback signals (current and displacement)obtained are transformed into a frequency series utilizing Fast Fourier Transformation (FFT) and utilized in developed algorithm. To establish the accuracy and effectiveness of the methodology, the estimated parametersare evaluated under two different frequency bands against measurement and modelling error (5% variation in mass of the disc and bearing characteristic parameters).

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