T B Ghosh
Articles written in Pramana – Journal of Physics
Volume 29 Issue 3 September 1987 pp 285-301 Condensed Matter Physics
New studies of X-ray diffraction line profiles from aggregates of distorted crystallites I
The fourth central moment of an X-ray diffraction profile from an aggregate of distorted crystallites has been expressed by Mitra (1964a) as a function of the crystallite size, strain and strain gradients in the specimen. While the usual methods of line profile analysis yield information regarding either the apparent strain or the rms strain, the present study provides additional information regarding strain distribution in the form of strain derivatives and rms displacements of atoms over a given distance
Volume 31 Issue 3 September 1988 pp 215-220 Condensed Matter Physics
X-ray diffraction line profile from the aggregate of distorted crystallites. II
An expression for the fourth moment of the line profile in terms of several strain derivatives and the possibility of measuring the ‘wavelength’ of crystal distortions (
Volume 57 Issue 4 October 2001 pp 809-820 Research Articles
Near surface composition of some alloys by X-ray photoelectron spectroscopy
Chemical compositions of the alloys of CuNi (Cu0.10Ni0.90, Cu0.30Ni0.70, Cu0.70Ni0.30) and BiSb (Bi0.80Sb0.20, Bi0.64Sb0.34, Bi0.55Sb0.45) are determined by X-ray photoelectron spectroscopy. The stoichiometries are determined and are compared with the bulk compositions. Possible sources of systematic errors contributing to the results are discussed. Errors arising out of preferential etching in these alloys have been investigated. It has been inferred from such studies that the preferential etching does not enrich the surface composition with a particular component for the two systems reported here. Quantitative results of CuNi system indicate that the surface regions of the Cu0.70Ni0.30 alloy is Cu-rich, although no such evidence is observed in case of BiSb system.
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