S B Ogale
Articles written in Pramana – Journal of Physics
Volume 14 Issue 5 May 1980 pp 343-348 Solid State Physics
Thermally stimulated current spectra of nitrogen implanted fluorinated ethylene propylene polymer foils have been studied. Two characteristic peaks have been obtained for samples implanted with nitrogen ions with energies ranging from 20 to 60 keV. The variations in the activation energies and relaxation times of charge carriers, as a function of implantation energy, have been attributed to the corresponding changes in the carrier distribution in the polymer. The carrier mobilities and mobility life-time products have also been estimated for the two characteristic peaks.
Volume 15 Issue 1 July 1980 pp 75-83 Solid State Physics
Resistance changes in thin films of copper, aluminium and bismuth have been studied under the bombardment of nitrogen, carbon and argon ions. Variations in resistance with implantation dose have been observed upto doses of ∼ 3 × 1017 ions/cm2 for ion energies in the range 40 to 120 keV. The results are discussed in terms of desorption of gases from the film and a composite action of sputter removal of the film and its structural changes upon ion bombardment. A simple theoretical model is discussed which can qualitatively explain the experimental observations.
Volume 37 Issue 4 October 1991 pp 373-385
An automated linear laboratory EXAFS spectrometer of the Johansson type has been indigenously developed. Only two translational motions are required to achieve the necessary Rowland circle configuration for the (fixed) X-ray source, the dispersing and focusing bent crystal and the receiving slit. With the available crystals the spectral region from 5 to 25 keV can be scanned. The linear motions of the crystal and receiving slit including the detector assembly are achieved by employing software-controlled DC motors and utilizing optical encoders for position sensing. The appropriate rotation of the crystal is achieved by the geometry of the instrument. There is a facility to place the sample alternately in the path of the X-ray beam and out of the path to record both the incident X-ray intensity
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