Articles written in Pramana – Journal of Physics
Volume 14 Issue 6 June 1980 pp 501-507 Instrumentation
The effect of diffusion of silver through Se thin films, on the visibility of two and multiple beam interference fringes has been studied. For thickness measurements, Al has been found to be a suitable overcoating metallic layer as it does not diffuse through Se. The thickness was measured by multiple beam fringes at reflection.
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