• S Mondal

      Articles written in Pramana – Journal of Physics

    • Energy and angular distributions of electrons ejected from CH4 and C3H8 under 16.0 keV electron impact

      S Mondal R K Singh R Shanker

      More Details Abstract Fulltext PDF

      Relative cross sections, differential in energy and angle, for electrons ejected from CH4 and C3H8 molecules under 16.0 keV electron impact have been measured. Electrons were analyzed by a 45° parallel plate electrostatic analyzer at emission angles varying from 60° to 135° with energies from 50 eV to 1000 eV. The angular distributions of electrons exhibit structures which are found to arise from Coulomb and non-Coulomb interactions. Furthermore, the double differential cross sections of electrons ejected from C3H8 molecule are found to be higher in magnitude than those from CH4. This result supports the fact that the number of ejected electrons participating in collisions with C3H8 molecules is more than that in CH4. Also, the angular distributions of C-K-shell Auger electrons emitted from the target molecules have been studied and shown to be isotropic within the experimental uncertainty

    • Effect of Al doping on microstructure and optical band gap of ZnO thin film synthesized by successive ion layer adsorption and reaction

      S Mondal S R Bhattacharyya P Mitra

      More Details Abstract Fulltext PDF

      Thin films of pure and aluminum-doped zinc oxide (AZO) were deposited on glass substrates from ammonium zincate bath following a chemical dipping technique called successive ion layer adsorption and reaction (SILAR). Characterization techniques such as X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy-dispersive X-rays (EDX) were used to investigate the effect of Al doping on the microstructure of AZO films. Particle size analysis using X-ray line broadening shows marginally increasing trend with increasing Al impurity. The average particle size for pure ZnO is 22.75 nm. It increases to 24.26 nm for 1% AZO film and 25.13 nm for 2% AZO film. Incorporation of Al was confirmed from elemental analysis using EDX. SEM micrograph shows that pure ZnO particles are spherical shaped. However, AZO films show particles with off-spherical shape with compact interconnected grains. The value of band gap for pure ZnO is 3.229 eV and it increases to 3.29 eV for 1% AZO indicating a blue-shift for 1% AZO film. However, for 2% AZO film, a decrease in band gap compared to pure ZnO is observed indicating a red-shift of fundamental absorption edge. Electrical resistance shows an initial decrease with increasing Al content. With further enhancement of Al incorporation, the resistance increases.

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