• N D Kataria

      Articles written in Pramana – Journal of Physics

    • Josephson voltage standard at National Physical Laboratory, New Delhi

      A K Gupta N S Natarajan V S Tomar N D Kataria V K Batra A V Narlikar K Chandra

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      A C Josephson effect is now used by several countries as the reference standard for the unit of d.c. voltage. This paper describes the work done at the National Physical Laboratory (NPL), New Delhi in the realization of the unit of volt based on the a.c Josephson effect. A voltage standard at 1 mV level using a Nb-Nb point contact junction has been established and the as-maintained volt based on a bank of standard cells has been intercompared against it using a 1:1000 voltage divider. The experimental set-up used in this comparison and the results of recent measurements are described. The overall uncertainty in assigning the value of emf to a standard cell is about 1 ppm. The as-maintained volt has been found to agree with the Josephson voltage within overall uncertainty.

    • X-ray diffraction analysis and occurrence of multiple phases in Bi-Sr-Ca-Cu-O superconductors

      N D Kataria Mukesh Kumar V S Tomar V N Ojha G S N Reddy K C Nagpal A K Gupta

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      Starting composition 1112 for Bi-Sr-Ca-Cu-oxide yields multiphase super-conductors with the proportion of constituent phases depending sensitively on the annealing temperature. The R-T curves show zero resistivity and the transition corresponding toTc = 80 K phase prominently. However, indexing of X-ray diffraction peaks reveals presence of 80 K (lowTc) as well as 108 K (highTc) phase. The lowTc phase thus corresponds to the orthorhombic structure with a unit cell ofa = 5.4Å,b = 27 Å andc = 30.56 Å. This is further understood to be composed of a pseudotetragonal cell ofa =b = 5.41 Å. The highTc phase similarly pertains to the orthorhombic structure withc = 36 Å.

    • Sensitivity of surface resistance measurement of HTS thin films by cavity resonator, dielectric resonator and microstrip line resonator

      N D Kataria Mukul Misra R Pinto

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      Microwave surface resistance (Rs) of silver-doped YBa2Cu3O7-δ (YBCO) thin film, deposited by laser ablation technique on 10 mm × 10 mm LaAlO3 substrate, has been measured by resonant techniques in the frequency range from 5 GHz to 20 GHz. The geometrical factor of the sample and the resonator has been determined theoretically by the knowledge of the electromagnetic field distribution in the resonators. The microwave surface resistance of the superconducting sample is then extracted from the measured Q value as a function of temperature. The sensitivity of the Rs measurement, that is, the relative change in the Q value with the change in the Rs value is determined for each resonator.

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