The set-up described here involves a large-area microchannel plate (MCP) detector, equipped with a 90-degree bender used to reflect the lightweight charged particles. To measure the energy of ions, ions have to be passed through the detector. The assembled MCP detector provides the signature of the detection of high-energy particles by producing a shower of secondary electrons. The MCP detector is designed and developed using areflecting mirror, supporting screws, conversion foil, a teflon base and a collimator. The passage of ions through the collimator and then from the conversion foil generates secondary electrons which are bent down by the reflectorbefore the detection. Also, the working of the MCP detector developed at BARC is tested with strontium-90 (primary electron source) and Th 232 (alpha emitter). Lower cost and low value of fall time constant (less than 2 ns) are the attractive features of the MCP. Additionally, the MCP has been used in the detection of a low-energy electron where a timing resolution of a few hundreds of picosecond to nanoseconds is desired.