Meyer–Neldel (MN) formula for DC conductivity ($\sigma_{\text{DC}}$) of chalcogenide glasses is obtained using extended pair model and random free energy barriers. The integral equations for DC hopping conductivity and external conductance are solved by iterative procedure. It is found that MN energy ($\Delta E_{\text{MN}}$) originates from temperature-induced configurational and electronic disorders. Single polaron-correlated barrier hopping model is used to calculate $\sigma_{\text{DC}}$ and the experimental data of Se, As₂S₃, As₂Se₃ and As₂Te₃ are explained. The variation of attempt frequency $\upsilon_0$ and $\Delta E_{\text{MN}}$ with parameter $(r/a)$, where 𝑟 is the intersite separation and 𝑎 is the radius of localized states, is also studied. It is found that $\upsilon_0$ and $\Delta E_{\text{MN}}$ decrease with increase of $(r/a)$, and $\Delta E_{\text{MN}}$ may not be present for low density of defects.