K K Dwivedi
Articles written in Pramana – Journal of Physics
Volume 29 Issue 5 November 1987 pp 485-490 Nuclear Physics
A simple experimental technique has been described for measuring range and energy-loss of any heavy ion in any complex medium with the help of a sensitive solid state nuclear track detectors (SSNTDs). In this paper we present the results obtained from our measurements of ranges and energy-loss of 16.34 MeV/u238U in Makrofol-N using CR-39 track detector. Experimental ranges are compared with the corresponding theoretical values. The significance and scope of the present work are discussed.
Volume 31 Issue 3 September 1988 pp 197-203 Nuclear Physics
Latent damage tracks of energetic40Ar ions (18·56 MeV/
Volume 37 Issue 5 November 1991 pp 431-436
Triafol-TN plastic detector foils have been irradiated with238U ions of energy 16.34 MeV/u and the tracks produced have been observed using the chemical etching technique. The bulk etch rate and track etch rate are determined under successive chemical etching. In our case, the validity of Arrhenius’s law is confirmed by the fact that the same value of
Volume 54 Issue 5 May 2000 pp 777-784 Research Articles
In the present work, attempts have been made to investigate the modification in particle track etching response of polyallyl diglycol carbonate (PADC) due to impact of 2 MeV electrons. PADC samples pre-irradiated to 1, 10, 20, 40, 60, 80 and 100 Mrad doses of 2 MeV electrons were further exposed to 140 MeV28 Si beam and dose-dependent track registration properties of PADC have been studied. Etch-rate values of the PADC irradiated to 100 Mrad dose electron was found to increase by nearly 4 times that of pristine PADC. The electron irradiation has promoted chain scissioning in PADC, thereby converting the polymer into an easily etchable polymer. Moreover, the etching response and the detection efficiency were found to improve by electron irradiation. Scanning electron microscopy of etched samples further revealed the surface damage in these irradiated PADCs.
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