Thermally stimulated current spectra of nitrogen implanted fluorinated ethylene propylene polymer foils have been studied. Two characteristic peaks have been obtained for samples implanted with nitrogen ions with energies ranging from 20 to 60 keV. The variations in the activation energies and relaxation times of charge carriers, as a function of implantation energy, have been attributed to the corresponding changes in the carrier distribution in the polymer. The carrier mobilities and mobility life-time products have also been estimated for the two characteristic peaks.

Resistance changes in thin films of copper, aluminium and bismuth have been studied under the bombardment of nitrogen, carbon and argon ions. Variations in resistance with implantation dose have been observed upto doses of ∼ 3 × 10¹⁷ ions/cm² for ion energies in the range 40 to 120 keV. The results are discussed in terms of desorption of gases from the film and a composite action of sputter removal of the film and its structural changes upon ion bombardment. A simple theoretical model is discussed which can qualitatively explain the experimental observations.