PARVEEN CHHUNEJA
Articles written in Journal of Genetics
Volume 91 Issue 2 August 2012 pp 155-161 Research Article
Introgression of a leaf rust resistance gene from
Amandeep Kaur Riar Satinder Kaur H. S. Dhaliwal Kuldeep Singh Parveen Chhuneja
Rusts are the most important biotic constraints limiting wheat productivity worldwide. Deployment of cultivars with broad spectrum rust resistance is the only environmentally viable option to combat these diseases. Identification and introgression of novel sources of resistance is a continuous process to combat the ever evolving pathogens. The germplasm of nonprogenitor
Volume 95 Issue 4 December 2016 pp 933-938 RESEARCH ARTICLE
PUNEET INDER TOOR SATINDER KAUR MITALY BANSAL BHARAT YADAV PARVEEN CHHUNEJA
A pair of stripe rust and leaf rust resistance genes was introgressed from Aegilops caudata, a nonprogenitor diploid species with the CC genome, to cultivated wheat. Inheritance and genetic mapping of stripe rust resistance gene in backcrossrecombinant inbred line (BC-RIL) population derived from the cross of a wheat–Ae. caudata introgression line (IL) T291-2(pau16060) with wheat cv. PBW343 is reported here. Segregation of BC-RILs for stripe rust resistance depicted a single major gene conditioning adult plant resistance (APR) with stripe rust reaction varying from TR-20MS in resistant RILs signifying the presence of some minor genes as well. Genetic association with leaf rust resistance revealed that two genes are located at a recombination distance of 13%. IL T291-2 had earlier been reported to carry introgressions on wheat chromosomes 2D, 3D, 4D, 5D, 6D and 7D. Genetic mapping indicated the introgression of stripe rust resistance gene on wheat chromosome 5DS in the region carrying leaf rust resistance gene LrAc, but as an independent introgression. Simple sequence repeat (SSR) and sequence-tagged site (STS) markers designed from the survey sequence data of 5DS enriched the target region harbouring stripe and leaf rust resistance genes. Stripe rust resistance locus, temporarily designated as YrAc, mapped at the distal most end of 5DS linked with a group of four colocated SSRs and two resistance gene analogue (RGA)-STS markers at a distanceof 5.3 cM. LrAc mapped at a distance of 9.0 cM from the YrAc and at 2.8 cM from RGA-STS marker Ta5DS_2737450, YrAc and LrAc appear to be the candidate genes for marker-assisted enrichment of the wheat gene pool for rust resistance.
Volume 100 All articles Published: 11 February 2021 Article ID 0006 RESEARCH ARTICLE
Introgression and genetic mapping of leaf rust and stripe rust resistance in
SHIKSHA ARORA SATINDER KAUR GURIQBAL SINGH DHILLON ROHTAS SINGH JASPAL KAUR ACHLA SHARMA PARVEEN CHHUNEJA
The growing and cultivating resistant wheat crop varieties is important to meet the demands of the growing population andminimizing the yield losses due to foliar diseases. More important is the identification of novel resistance sources and transfer of resistancein ready to use form. In the current study, leaf rust (LR) and stripe rust (YR) resistant tetraploid nonprogenitors of wheat
Volume 101 All articles Published: 8 April 2022 Article ID 0025 RESEARCH ARTICLE
Molecular mapping of CLCuD resistance introgressed from synthetic cotton polyploid in upland cotton
SURUCHI VIJ DHARMINDER PATHAK PANKAJ RATHORE HARISH KUMAR P. S. SEKHON DHARMINDER BHATIA PARVEEN CHHUNEJA KULDEEP SINGH
Cotton leaf curl disease (CLCuD), caused by a geminivirus complex, is the most serious disease of upland cotton in northwest India and Pakistan. It results in substantial losses in cotton yield and fibre quality. Due to continuous appearance of new viral strains, all the established CLCuD resistant stocks, extant and obsolete cultivars of upland cotton have become susceptible. Therefore, it became crucial to explore the novel sources of CLCuD resistance, as development of CLCuD resistant varieties is the most practical approach to manage this menace. Here, for the first time, we report introgression and mapping of CLCuD resistance from a ‘synthetic cotton polyploid’ to uplandcotton. A backcross population (synthetic polyploid /
Volume 102, 2023
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