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Ulvi Avciata
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Volume 37 Issue 3 May 2014 pp 461-468
Bahadir Keskin Ahmet Altindal Ulvi Avciata Ahmet Gül
The d.c. and a.c. electrical transport properties of Au/Pz/Au devices with various thickness of Pz(octakis[(4-tert-butylbenzylthio)-porphyrazinato]Cu(II)) layer have been investigated. Measurements revealed that, in contrast to previously investigated Au/Pc/Au structures, low voltage d.c. behaviour of the films can be described by the field-lowering mechanisms with a $\log$(𝐽) ∝ 𝑉1/2 current density-voltage characteristics under forward and reverse bias. For high reverse voltages, the observed ln (𝐽/𝑉2) - 1/𝑉 characteristics indicated that the origin of conduction mechanism is Fowler–Nordheim tunnelling (FNT). On the other hand, the voltage dependence of current density at the higher forward-voltage region indicates that the mechanism of conduction in Au/Pz/Au devices is space charge limited conduction dominated by exponential trap distribution. A thickness independent barrier height was observed for tunnelling, while the total trap concentration show a general tendency to decrease with increasing film thickness. The a.c. conductivity showed two regions in the ln (𝜎a.c.) - ln(𝑓) plots having different slopes, leading to the conclusion that for low frequency region, the dominant conduction mechanism is a small polaron tunnelling at all temperatures, whereas for high frequency region, correlated barrier hopping model is the dominant mechanism in the investigated devices.
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Bulletin of Materials Science
Volume 45, 2022
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