• S V S Tyagi

      Articles written in Bulletin of Materials Science

    • Electron microscopy study of chemically deposited Ni-P films

      S V S Tyagi V K Tandon S Ray

      More Details Abstract Fulltext PDF

      The structure of electroless thin films of Ni-P has been studied. The microstructure and the selected area diffraction pattern of the samples reveal that certain samples transform to crystalline Ni with P in solid solution by nucleation and growth, whereas others transform to crystalline state by growth alone. The former set of thin films having a P-content of 19–21 at.% is characterized as amorphous. Films with a P-content of 13–15 at.% fall in the latter category and are characterized as microcrystalline. Those with a P-content of 16–18 at.% contain both amorphous and microcrystalline regions.

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