Articles written in Bulletin of Materials Science
Volume 7 Issue 1 March 1985 pp 63-69
Thin films of tellurium of wide range of thicknesses have been deposited by vacuum evaporation and their electrical properties such as electrical resistivity and temperature coefficient of resistance have been measured. The suitability of these films for possible use as strain gauges has been studied and their strain resistivity behaviour is presented. The thermal conductivity of these films have been determined and these results are presented alongwith. An interesting phenomenon has been noticed. In all these effects an extraordinary behaviour is observed at a specific thickness. This smears out with an increase in the thickness of the film. These effects are explained in terms of size effects in thin films.
Volume 13 Issue 3 June 1990 pp 191-195
The structural study of ZnCuTiO4, ZnCuSnO4 and ZnCuGeO4 reveals that while the cooperative
Volume 42 | Issue 6
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