Rahul Sen
Articles written in Bulletin of Materials Science
Volume 20 Issue 1 February 1997 pp 1-7
An atomic force microscope study of carbon onions and related nanoparticles
Carbon onions are found along with carbon nanotubes and other carbon nanoparticles in the cathodic deposit in the arc-vaporization of graphite. Atomic force microscopy has been used to characterize these particles on the basis of their sizes and shapes. Onion-like particles have three-dimensional, near spherical structure and are distinct from two-dimensional graphitic particles. The spherical shape and height to diameter ratios obtained using atomic force microscope, afford a distinction between onion-like structures and other carbon nanoparticles.
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Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
Chemical Sciences 2020
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