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Volume 45 All articles Published: 24 May 2022 Article ID 0094
Accelerated potential-induced degradation technology for crystalline silicon cells
QIYAN SUN MINGXI LI XI XI GUILIN LIU LAN WANG BINGJIE ZHU LIPING CHEN
Potential-induced degradation (PID) is recently recognized as one of the most important degradation mechanisms in crystalline silicon cells as well as in photovoltaic (PV) modules. The ability of solar cells to resist PID effect is one of the key indicators of product quality monitoring. Traditional PID testing methods are complex and require up to 96 h in treating. To accelerate the PID test, a rapid PID treatment technology was urgent for PV field, which can extremely decrease the time expense. Hence, we have introduced a novel rapid PID treating technology, which reduced the treatment time from nearly 100 h to less than 8 h. This technology was applying an electric field directly on the solar cells to simulate the PID process of the modules. The process was named as electric field treatment (EFT). The effect of the applied EFT voltage on the solar cells was investigated from 1 to 1.8 KV. The degradation rate of the solar cells increased with increase in EFT voltage. The result of the energy dispersive spectrometer showed that the sodium element was found in the shunt area of the cell. It indicated that the microscopic principle of the power loss of the cell caused by the EFT was in accordance with that of the traditional PID. The electric performances of the cells treated by EFT showed that the PID test time can be accelerated to less than 8 h.
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Bulletin of Materials Science
Volume 46, 2023
All articles
Continuous Article Publishing mode
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Bulletin of Materials Science | News
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Dr Shanti Swarup Bhatnagar for Science and Technology
Posted on October 12, 2020Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
Chemical Sciences 2020Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
Physical Sciences 2020 -
Editorial Note on Continuous Article Publication
Posted on July 25, 2019Click here for Editorial Note on CAP Mode
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