Articles written in Bulletin of Materials Science
Volume 18 Issue 5 September 1995 pp 557-562
Stoichiometric polycrystalline tin oxide thin films were deposited by the reactive evaporation of tin and the SnO2 formation was found to be strongly dependent on the deposition parameters. The preferred orientation of the SnO2 films deposited on different substrates was varying due to the dislocation defects arising during the thin film formation. The X-ray diffraction (XRD) studies identified a tetragonal structure while the scanning electron microscopic (SEM) studies revealed a polycrystalline surface for the SnO2 films reactively deposited.
Volume 22 Issue 5 August 1999 pp 921-926 Thin Films
Zinc oxide thin films were prepared on glass substrates from an aqueous solution of zinc acetate by spray pyrolysis. These films were characterized using X-ray diffraction, scanning electron microscopy and optical transmission. The films were highly transparent to the visible radiation and electrically conductive. Films deposited at optimum conditions exhibited a resistivity of 3·15×10−3 Ωm along with a transmittance of 98% at 550 nm.
Volume 44, 2021
Continuous Article Publishing mode
Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
Chemical Sciences 2020
Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
Physical Sciences 2020
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