Articles written in Bulletin of Materials Science
Volume 34 Issue 3 June 2011 pp 483-489
The growth characteristics of titanium films deposited on glass, silicon (100) and oxygen free high purity copper substrate using magnetron sputtering have been investigated using X-ray diffraction, electron microscopy and scratch indentation techniques. The study of interface between the titanium film and the substrate was carried out to determine coating thickness, as well as intermixing of the elements at the interface. Studies revealed that the interface is free from voids and intermixing of the film and the substrate. Microstructural and diffraction analysis showed that the Ti coating was polycrystalline and exhibited columnar growth. The Ti crystallite size varied between 24 and 58 nmdepending on the substrate. The thickness of the films were typically about 4 𝜇m. Scratch test indicated that the films are adherent and the first critical load to failure was observed to be 4.5 N ± 2 N.
Volume 38 Issue 2 April 2015 pp 401-407
Phase stability of nanostructured thin films can be significantly different from the stability of the same materials in bulk form because of the increased contribution from surface and interface effects. Zirconia (ZrO2), stabilized in tetragonal and cubic phases, is a technologically important material and is used for most high temperature applications. In literature, zirconia can be found to be stabilized in its high temperature phases down to room temperature via two routes, doping with divalent or trivalent cations and crystallite size controls. Apart from these, in the alumina/zirconia thin-film multilayer system, a constraining effect on the zirconia layers provides another route to stabilization of the tetragonal zirconia phase at room temperature. However, in such nanostructured geometries, at high temperatures, the small diffusion lengths involved can influence the phase stability. The present work deals with the high-resolution transmission electron microscope (HRTEM) studies of pulsed laser ablated alumina–zirconia thin-film multilayers in the as deposited state and annealed up to 1473 K at 2 × 10−5 mbar. Conventional techniques such as X-ray diffraction lack the ability to detect localized phase changes at nanometre length scales and also for the low volume fraction of newly formed phases. Cross-sectional HRTEM techniques have been successful in detecting and characterizing these interactions.
Volume 44, 2021
Continuous Article Publishing mode
Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
Chemical Sciences 2020
Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
Physical Sciences 2020
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