• M S Rahman Khan

      Articles written in Bulletin of Materials Science

    • Hillock and island formation during annealing of gold films

      M S Rahman Khan

      More Details Abstract Fulltext PDF

      Kinetics of the hillock and island formation during annealing of thin gold film has been studied. The reorganisation of gold film has been distinguished in five stages in progression from the original film to the final island structure. The area occupied by the holes remained virtually constant until the removal of the metal from the substrate started. No increase in the number of holes was detected in the induction period. Hole densities decrease with increasing film thickness. Agglomerates were frequently found at the side of an enlarging hole. The hole growth rate increased steadily with temperature. The growth rate of holes eventually leads to a network structure. The catchment area increased with increasing initial film thickness.

    • Electrical resistivity of holmium hydride films

      M S Rahman Khan

      More Details Abstract Fulltext PDF

      The electrical resistivity and temperature coefficient of resistance of polycrystalline holmium hydride films, grown on glass slides, have been measured in vacuo. Experimental results show that the resistivity decreases with decreasing film thickness. The resistivity of 200 Å holmium dihydride film is less than that of the parent metal. The observed behaviour of the thickness dependence of the resistivity has been explained in terms of the structural phase change.

  • Bulletin of Materials Science | News

    • Dr Shanti Swarup Bhatnagar for Science and Technology

      Posted on October 12, 2020

      Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
      Chemical Sciences 2020

      Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
      Physical Sciences 2020

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

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