M P Janawadkar
Articles written in Bulletin of Materials Science
Volume 20 Issue 4 July 1997 pp 503-507
The structural instability in Ti rich compositions of Nb-Ti alloy system, which leads to various anomalies in the normal and superconducting state properties, has been extensively studied in bulk samples in the past. In this paper we report the formation of thin films of several compositions in the Ti rich region of this alloy system by RF magnetron sputtering and investigation of their electrical properties. Compositional analysis of two representative films was carried out by the RBS technique and the compositions agreed to within 2% of the targeted values. The anomalous variations in the electrical properties characteristic of the bulk, which can be ascribed to the structural instability related to the formation of athermal ω-phase, are also observed in thin films.
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