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M Bhattacharya
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Volume 34 Issue 3 June 2011 pp 507-513
P S Chowdhury P Mukherjee N Gayathri M Bhattacharya A Chatterjee P Barat P M G Nambissan
Zr–1Nb samples were irradiated with 116 MeV O5+ ions at different doses ranging from 5 × 1017 to 8 × 1018 O5+/m2. X-ray diffraction line profile analysis was performed to characterize the microstructural parameters of these samples. Average domain size, microstrain and dislocation density were estimated as a function of dose. An anomaly was observed in the values of these parameters at a dose of 2 × 1018 O5+/m2. Positron annihilation spectroscopy was used to determine the existence and nature of vacancy clusters in the samples. Isochronal annealing was carried out for a sample to study the evolution of defect clusters.
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Bulletin of Materials Science
Volume 43, 2020
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Continuous Article Publishing mode
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Bulletin of Materials Science | News
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Dr Shanti Swarup Bhatnagar for Science and Technology
Posted on October 12, 2020Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
Chemical Sciences 2020Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
Physical Sciences 2020 -
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Posted on July 25, 2019Click here for Editorial Note on CAP Mode
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