Kolluri V Ramanaiah
Articles written in Bulletin of Materials Science
Volume 3 Issue 3 November 1981 pp 307-315
Single crystals and mixed crystals of KH2PO4 (KDP) and NH4H2PO4 (ADP) were grown with different dopant concentrations of NH4H2PO4 in KH2PO4 in solution by Holden’s rotary crystallizer technique. The effect of additives like Borax (Na2B4O7·10H2O), seed crystal rotation rate and qualities of the crystals were studied. The half-wave voltages (in longitudinal mode) for KDP mixed with 1% ADP (by weight) were found and hence the unclamped (low frequency) electro-optic coefficients (
Volume 7 Issue 1 March 1985 pp 63-69
Thin films of tellurium of wide range of thicknesses have been deposited by vacuum evaporation and their electrical properties such as electrical resistivity and temperature coefficient of resistance have been measured. The suitability of these films for possible use as strain gauges has been studied and their strain resistivity behaviour is presented. The thermal conductivity of these films have been determined and these results are presented alongwith. An interesting phenomenon has been noticed. In all these effects an extraordinary behaviour is observed at a specific thickness. This smears out with an increase in the thickness of the film. These effects are explained in terms of size effects in thin films.
Volume 42 | Issue 6
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