K Rajasree
Articles written in Bulletin of Materials Science
Volume 15 Issue 2 April 1992 pp 183-188
K Rajasree A V Ravikumar P Radhakrishnan V P N Nampoori C P G Vallabhan
Photothermal deflection technique was used for determining the laser damage threshold of polymer samples of teflon (PTFE) and nylon. The experiment was conducted using a Q-switched Nd-YAG laser operating at its fundamental wavelength (1-06μm, pulse width 10 nS FWHM) as irradiation source and a He-Ne laser as the probe beam, along with a position sensitive detector. The damage threshold values determined by photothermal deflection method were in good agreement with those determined by other methods.
Current Issue
Volume 42 | Issue 6
December 2019
Click here for Editorial Note on CAP Mode
© 2017-2019 Indian Academy of Sciences, Bengaluru.