K G M Nair
Articles written in Bulletin of Materials Science
Volume 16 Issue 1 February 1993 pp 45-49
The use of Cs+ primary ions in conjunction with the detection of CsHe+ molecular ions is proposed for the analysis of helium in metals by secondary ion mass spectrometry (SIMS). Concentration depth profiles of helium implanted at 100keV in Al60Mn40 alloy have been measured. Helium concentrations down to about 100 ppm were measured at moderately low sputtering rate of 0·5nm/sec. The experimentally determined implantation profile of helium is compared with the theoretical profile obtained using the Monte Carlo Code TRIM.
Volume 19 Issue 1 February 1996 pp 61-72
Dynamic and non-equilibrium effects involving interaction between deuterium and radiation produced defects were studied during deuterium implantation of Cu and Ti. The technique of neutron yield measurement during deuterium implantation was employed and theoretical analysis was made to study the dynamics. SIMS, GIXRD and SEM studies on deuterium implanted samples were employed to study the evolution of implanted deuterium profiles, structure of deuterides and surface topography respectively.
Volume 20 Issue 3 June 1997 pp 287-295
CdS thin films prepared by chemical bath deposition technique are characterized using X-ray diffraction, optical absorption spectrometry and scanning electron microscopy. The results of the annealing studies on the films in flowing argon and air atmospheres are also presented in this paper. The resistivity has drastically reduced on annealing in flowing air which is attributed to the partial conversion of CdS to CdO phase.
Volume 20 Issue 4 July 1997 pp 583-589
Amorphization is often observed during irradiation of intermetallic compounds with energetic charged particles or neutrons. This paper discusses various mechanisms of radiation induced amorphization and also presents the results of amorphization in Al-Mn alloys.
Volume 21 Issue 4 August 1998 pp 303-308 Nucleation And Growth Studies
Grazing incidence X-ray diffraction, performed on a 70 keV nitrogen implanted Ti-6Al-4V system, reveals phase instabilities, during the course of nitride formation. With the build up of unbound N atom concentration, for a dose of 1×1016 ions/cm2, the surface region becomes
Volume 46, 2023
Continuous Article Publishing mode
Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
Chemical Sciences 2020
Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
Physical Sciences 2020
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