• G Singh

      Articles written in Bulletin of Materials Science

    • Lattice imaging studies on the structure and non-random disorder in SiC crystals

      S R Singh G Singh

      More Details Abstract Fulltext PDF

      A number of SiC crystals having extremely large period unit cells and one-dimensionally disordered structures have been studied by x-ray diffraction and lattice imaging in the electron microscope. It has been observed that structures of extremely large periodicities (>100 nm) can be conveniently studied by lattice imaging technique which simply give continuous streaks in their x-ray diffraction patterns. This has been shown in the case of 150R, 150RA, 900R and another structure whosec-repeat period is more than 100 nm. SiC crystals showing streaks alongc*-direction in x-ray diffraction are found to possess either completely ordered structures with extremely large periodicities or non-random disorder.

    • High resolution electron microscopy as a tool for structural investigations

      G Singh R S Rai

      More Details Abstract Fulltext PDF

      Lattice imaging technique has been used to study an unknown high period polytype structure of SiC. A known structure like 6H has been studied by tilted beam two-dimensional images to determine optimum conditions for deriving structural information. The technique has then been used to determine a new structure (411R and its intergrowth structures), and the lattice imaging technique as a tool for structural investigation has been critically evaluated.

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