Articles written in Bulletin of Materials Science
Volume 6 Issue 4 September 1984 pp 665-676
We present a theoretical model of repeated yielding (
Volume 10 Issue 1-2 March 1988 pp 77-83
Random walk on a Fibonacci chain is studied both numerically and analytically. We demonstrate that the long-time behaviour is diffusive.
Volume 17 Issue 6 November 1994 pp 771-781
There has been revival of interest in Jerky flow from the point of view of dynamical systems. The earliest attempt in this direction was from our group. One of the predictions of the theory is that Jerky flow could be chaotic. This has been recently verified by us. We have recently extended the earlier model to account for the spatial aspect as well. Both these models are in the form of coupled set of nonlinear differential equations and hence, they are complicated in their structure. For this reason we wish to devise a model based on the results of these two theories in the form of coupled lattice map for the description of the formation and propagation of dislocation bands. We report here one such model and its results.
Volume 20 Issue 6 September 1997 pp 823-843 India-Japan Seminar On New Materials
We study thin film growth using a lattice-gas, solid-on-solid model employing the Monte Carlo technique. The model is applied to chemical vapour deposition (CVD) by including the rate of arrival of the precursor molecules and their dissociation. We include several types of migration energies including the edge migration energy which allows the diffusive movement of the monomer along the interface of the growing film, as well as a migration energy which allows for motion transverse to the interface. Several well-known features of thin film growth are mimicked by this model, including some features of thin copper films growth by CVD. Other features reproduced are—compact clusters, fractal-like clusters, Frank-van der Merwe layer-by-layer growth and Volmer-Weber island growth. This method is applicable to film growth both by CVD and by physical vapour deposition (PVD).
Volume 42 | Issue 6
Click here for Editorial Note on CAP Mode