• F Singh

      Articles written in Bulletin of Materials Science

    • Irradiation of large area Mylar membrane and characterization of nuclear track filter

      N K Acharya P K Yadav S Wate Y K Vijay F Singh D K Avasthi

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      Ion irradiation of Si8+ ion beam of 100 MeV was scattered by a gold foil on a Mylar membrane of 25 𝜇m thickness in the form of film roll (width, 12.5 cm and length, 400 cm) at the Nuclear Science Centre, New Delhi. The characterization of etched nuclear tracks was carried out by gas permeation measurements. The samples cut from the film roll of required size for permeability measurements were etched in a controlled manner in a constant temperature bath of 6N NaOH solution. The opening of the conical etched tracks was characterized by hydrogen gas permeation.

    • Effect of ion beam irradiation on metal particle doped polymer composites

      N L Singh Sejal Shah Anjum Qureshi A Tripathi F Singh D K Avasthi P M Raole

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      Polymethyl methacrylate (PMMA) was prepared by solution polymerization method. Different concentrations (10, 20 and 40%) of Ni powder were dispersed in PMMA and the composite films were prepared by casting method. These films were irradiated with 120 MeV Ni$^{10+}$ ions at a fluence of 5 × 1012 ions/cm2. Electrical, structural and chemical properties of the composites were studied by means of an LCR meter, X-ray diffraction, FTIR spectroscopy and SEM/AFM, respectively. The results showed that the conductivity increases with metal concentration and also with ion beam irradiation. This reveals that ion beam irradiation promotes the metal/polymer bonding and converts polymeric structure into hydrogen depleted carbon network. It was observed from XRD analysis that percentage crystallinity and crystalline size decrease upon irradiation. This might be attributed to rupture of some polymeric bonds, which is also corroborated with FTIR spectroscopic analysis. Ion beam tempts graphitization of polymeric material by emission of hydrogen and/or other volatile gases. Surface morphology of the pristine and irradiated films was studied by atomic force microscopy (AFM)/scanning electron microscopy (SEM). Result showed that the surface roughness increases after ion beam irradiation.

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