Dinesh N Suryawanshi
Articles written in Bulletin of Materials Science
Volume 36 Issue 7 December 2013 pp 1153-1160
The objective of the present paper is to investigate the effect of variation of precursor concentration (0.01, 0.02 and 0.03 M) on the structural, microstructural, optical and gas sensing properties of TiO2 thin films. Titanium dioxide (TiO2) films were prepared from aqueous solution of titanium chloride (TiCl3.6H2O, 99.9%pure, Merckmade, Germany) onto the glass substrates heated at a temperature of 350 °C by the spray pyrolysis technique. Bandgap energy of the films vary from 3.28 to 3.29 eV. X-ray diffraction shows that films to be nanocrystalline with anatase phase having tetragonal crystal structure. The 𝑑 values calculated from electron diffraction patterns (TEM) were observed to be matching with 𝑑 values calculated from XRD. Transmission electron microscopy (TEM) reveled that grain sizes were observed to increase (10–29 nm) with an increase in the concentration of precursor solution. The gas sensing performance of the films was tested.
Volume 37 Issue 3 May 2014 pp 425-432
Nanostructured pure and Pt-doped TiO2 thin films were prepared by chemical spray pyrolysis technique. Aqueous solution of TiCl3.6H2O (0.01 M) was chosen as the starting solution for the preparation of pure TiO2 thin film. Aqueous solutions of PtCl6.6H2O (0.01 M) and TiCl3.6H2O (0.01 M) were mixed in volume % of 1 : 99, 2.5 : 97.5 and 5 : 95 respectively to obtain Pt-doped TiO2 thin films. The solutions were sprayed onto quartz substrate heated at 350 °C temperature to obtain the films. These thin films were fired for one hour at 550 °C. The sensing performance of these films was tested for various gases such as LPG, H2, CO2, ethanol, NH3 and Cl2 (1000 ppm). The Pt-doped TiO2 (1 : 99) was observed to be most sensitive (572) to H2 at 400 °C with high selectivity against other gases. Its response time was short (10 s) and recovery was also fast (14 s). To understand the reasons behind the gas-sensing performance of the films, their structural and micro-structral properties were studied using X-ray diffraction and electron microscopy (FE–SEM and TEM), respectively. Thicknesses of all these samples were determined using Surface Profiler. The results are interpreted.
Volume 43, 2020
Continuous Article Publishing mode
Click here for Editorial Note on CAP Mode