C P Vinod
Articles written in Bulletin of Materials Science
Volume 25 Issue 3 June 2002 pp 247-249 Experimental Techniques
𝐼–𝑧 spectroscopy measurements using a scanning tunnelling microscope (STM) were carried out to determine the change in the work function of a W tip following one monolayer (1 ML) deposition of Ni and subsequent annealing at 700 K. The variation in the actual gap voltage obtained from the 𝐼–𝑧 data of the clean tip was used in the calculation. The estimated values of the change in work function, 0.16 eV and 0.59 eV, for as-deposited and annealed tips, respectively match closely with the reported values. The method is generally applicable to chemically modified metal tips.
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