Ayan Roy Chaudhuri
Articles written in Bulletin of Materials Science
Volume 32 Issue 3 June 2009 pp 259-262
The electrocaloric effect is calculated for PMN–PT relaxor ferroelectric thin film near morphotropic phase boundary composition. Thin film of thickness, ∼ 240 nm, has been deposited using pulsed laser deposition technique on a highly (111) oriented platinized silicon substrate at 700°C and at 100 mtorr oxygen partial pressure. Prior to the deposition of PMN–PT, a template layer of LSCO of thickness, ∼ 60 nm, is deposited on the platinized silicon substrate to hinder the pyrochlore phase formation. The temperature dependent P–E loops were measured at 200 Hz triangular wave operating at the virtual ground mode. Maximum reversible adiabatic temperature change, 𝛥 𝑇 = 31 K, was calculated at 140°C for an external applied voltage of 18 V.
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