A K TYAGI
Articles written in Bulletin of Materials Science
Volume 6 Issue 3 July 1984 pp 595-602
High voltage electron microscope irradiation and observations in metallic glasses
High voltage electron microscope (
Volume 16 Issue 1 February 1993 pp 45-49
SIMS depth profiling of implanted helium in Al-Mn alloy using CsHe+ molecular ion detection
A K Tyagi K G M Nair K Krishan
The use of Cs+ primary ions in conjunction with the detection of CsHe+ molecular ions is proposed for the analysis of helium in metals by secondary ion mass spectrometry (SIMS). Concentration depth profiles of helium implanted at 100keV in Al60Mn40 alloy have been measured. Helium concentrations down to about 100 ppm were measured at moderately low sputtering rate of 0·5nm/sec. The experimentally determined implantation profile of helium is compared with the theoretical profile obtained using the Monte Carlo Code TRIM.
Volume 20 Issue 3 June 1997 pp 359-375
Mass spectrometry based evolved gas analysis system for thermal decomposition studies
An experimental facility for evolved gas analysis by mass spectrometry (EGA-MS) has been built in-house and extensively used to study the temperature programmed decomposition (TPD) of a number of inorganic solids. Fractional extent of reaction
Volume 42 Issue 5 October 2019 Article ID 0211
VIDYA S THORAT R K MISHRA V SUDARSAN AMAR KUMAR A K TYAGI C P KAUSHIK
Pellet leaching and associated thermal and structural changes of sodium borosilicate (NBS) glass, used for the immobilization of high-level radioactive liquid waste, subjected to aggressive test conditions have been compared with international simple glass (ISG) subjected to the same leaching conditions. The crystalline phase getting separated out from NBS glass is found to be different for pellets and powder leaching experiments and this has been explained based on the difference in the extent of leaching occurring with glass samples in the two experiments. Based on Fourier transform infrared studies, it is inferred that, unlike in the ISG sample, Si–O–Si/B structural units become more ordered with the leaching in the case of NBS glass, and this is attributed to the partial network destruction occurring with NBS glass and crystallization of the SiO₂ phase from the glass matrix. Both the NBS glass and ISG sample show L-centre emission and the emission intensity remained unaffected with leaching, confirming that the local environment around non-bridging oxygen atoms in the NBS glass and ISG sample are unaffected and leaching occurs through network dissolution.
Volume 42 Issue 6 December 2019 Article ID 0000 Editorial
Volume 45, 2022
All articles
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Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
Chemical Sciences 2020
Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
Physical Sciences 2020
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