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ANATOLY V NIKOLSKII
Articles written in Bulletin of Materials Science
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Volume 46 All articles Published: 31 January 2023 Article ID 0021
ALEXEY T KOZAKOV NIRANJAN KUMAR VALERY G VLASENKO ILIYA V PANKOV VADIM A VOLOCHAEV ANTON A SCRJABIN ANATOLY V NIKOLSKII ALEKSEY V NEZHDANOV RUSLAN M SMERTIN VLADIMIR N POLKOVNIKOV NIKOLAY I CHKHALO
The phase composition of periodic Mo/Si multilayers with different thicknesses of silicon and molybdenum layers, and bilayer films with the combination of Mo–on–Si and Si–on–Mo with varying thicknesses of the upper layers(Mo or Si) were investigated. X-ray diffraction and high-resolution transmission electron microscopy were used for the investigation of phases and microstructure of periodic multilayer. Core-levels and valence-bands X-ray photoelectron spectroscopy was performed for the study of electronic structure and phase composition of surface and interfaces in bilayer films. Although the intermetallic silicide phases (Mo$_5$Si$_3$, Mo$_3$ Si and MoSi$_2$) in multilayer and bilayersystems evolved similar, differences were observed in specific phases compared to bilayer systems in the Mo–on–Si and Si–on–Mo sequences. The amorphous silicon layer in periodic multilayers was highly disordered as compared to the amorphous layer of silicon in bilayer films. This was originated to formation of specific silicide phases in the periodic multilayers and bilayers systems.
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Bulletin of Materials Science
Volume 46, 2023
All articles
Continuous Article Publishing mode
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Bulletin of Materials Science | News
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Dr Shanti Swarup Bhatnagar for Science and Technology
Posted on October 12, 2020Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
Chemical Sciences 2020Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
Physical Sciences 2020 -
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Posted on July 25, 2019Click here for Editorial Note on CAP Mode
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