Differential scanning calorimeter (DSC) is employed to study the crystallization kinetics of irradiated (at three different fluences with high-energy heavy ion; Ni¹¹⁺ of 150 MeV) specimens of two Co-based metallic glasses. It is found that the crystallization process in both the glasses is completed in two phases. The DSC data have been analysed in terms of kinetic parameters viz. activation energy (𝐸_𝑐), Avrami exponent (𝑛), dimensionality of growth (𝑚), using two different theoretical models. The results obtained have been compared with that of virgin samples. The lower activation energy in case of second crystallization occurring at higher temperature indicates the easier nucleation of second phase. The abnormally high value of Avrami exponent in Co–Ni glass indicates very high nucleation rate during first crystallization.

Polymethyl methacrylate (PMMA) was prepared by solution polymerization method. Different concentrations (10, 20 and 40%) of Ni powder were dispersed in PMMA and the composite films were prepared by casting method. These films were irradiated with 120 MeV Ni$^{10+}$ ions at a fluence of 5 × 10¹² ions/cm². Electrical, structural and chemical properties of the composites were studied by means of an LCR meter, X-ray diffraction, FTIR spectroscopy and SEM/AFM, respectively. The results showed that the conductivity increases with metal concentration and also with ion beam irradiation. This reveals that ion beam irradiation promotes the metal/polymer bonding and converts polymeric structure into hydrogen depleted carbon network. It was observed from XRD analysis that percentage crystallinity and crystalline size decrease upon irradiation. This might be attributed to rupture of some polymeric bonds, which is also corroborated with FTIR spectroscopic analysis. Ion beam tempts graphitization of polymeric material by emission of hydrogen and/or other volatile gases. Surface morphology of the pristine and irradiated films was studied by atomic force microscopy (AFM)/scanning electron microscopy (SEM). Result showed that the surface roughness increases after ion beam irradiation.

BiFeO₃ (BFO) thin films of thickness about 800 nm deposited on Si (100) substrates by sol–gel spin coating method were irradiated by 200 MeV Ag ions. Modification of structure and surface morphology of the films under irradiation was studied using glancing incidence X-ray diffraction (GIXRD) and atomic force microscope (AFM). Fluence dependence of GIXRD peak intensity indicated formation of 10 nm diameter cylindrical amorphous columns in crystalline BFO due to 200 MeV Ag ion irradiation. AFM analysis indicated that the pristine film consists of agglomerated grains with diffuse grain boundary. Irradiation led to reduced agglomeration of the grains with the formation of sharper grain boundaries. The rms roughness (𝜎_rms) estimated from AFM analysis increased from 6.2 in pristine film to 12.7 nm when the film irradiated at a fluence of 1 × 10¹¹ ions cm^-2. Further irradiation led to decrease of 𝜎_rms which finally saturated at a value of 7–8 nm at high ion fluences. The power spectral density analysis indicated that the evolution of surface morphology of the pristine film is governed by the combined effect of evaporation condensation and volume diffusion processes. Swift heavy ion irradiation seems to increase the dominance of volume diffusion in controlling surface morphology of the film at high ion fluences.