pp 303-303 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

Foreword

S B Krupanidhi T L Prakash N R Munirathnam

pp 305-307 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

Powder metallurgical processing and metal purity: A case for capacitor grade sintered tantalum

G S Upadhyaya

pp 309-311 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

High purity tellurium production using dry refining processes

N R Munirathnam D S Prasad J V Rao T L Prakash

pp 313-316 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

Synthesis and purification of some main group organometallic precursors for compound semiconductors

Vimal K Jain

pp 317-323 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

Application of photoconductivity decay and photocurrent generation methods for determination of minority carrier lifetime in silicon

S N Singh R Gandotra P K Singh B C Chakravarty

pp 325-330 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

High purity materials as targets for radioisotope production: Needs and challenges

V Shivarudrappa K V Vimalnath

pp 331-337 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

Analytical challenges in characterization of high purity materials

K L Ramakumar

pp 339-343 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

State-of-the-art in analytical characterization of high purity solid samples by different spectroscopic methods

S S Grazhulene

pp 345-348 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

Recent developments in analytical techniques for characterization of ultra pure materials—An overview

V Balaram

pp 349-353 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

Growth of high purity semiconductor epitaxial layers by liquid phase epitaxy and their characterization

S Dhar

pp 355-360 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

Progress in III–nitrides: Process issue and purity perspective

J Kumar

pp 361-366 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

Multielement trace determination in high purity advanced ceramics and high purity metals

R Matschat H-J Heinrich M Czerwensky S Kuxenko H Kipphardt

pp 367-371 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

EBIC and DLTS characterization of pure Si crystals

E B Yakimov

pp 373-378 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

Certified reference materials of trace elements in water

A K Agrawal

pp 379-382 July 2005 International Symposium on “Ultrapure Materials: Processing, Characterization and Applications”, Hyderabad, 2004

Effect of residual elements on high performance nickel base superalloys for gas turbines and strategies for manufacture

O P Sinha M Chatterjee V V R S Sarma S N Jha