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    • Keywords


      Statistical timing analysis; VLSI clock interconnects; delay variability; PDF; process variation; Gaussian random variation; computational cost.

    • Abstract


      In this paper, we propose a novel and efficient algorithm for modelling sub-65 nm clock interconnect-networks in the presence of process variation. We develop a method for delay analysis of interconnects considering the impact of Gaussian metal process variations. The resistance and capacitance of a distributed RC line are expressed as correlated Gaussian random variables which are then used to compute the standard deviation of delay Probability Distribution Function (PDF) at all nodes in the interconnect network. Main objective is to find delay PDF at a cheaper cost. Convergence of this approach is in probability distribution but not in mean of delay. We validate our approach against SPICE based Monte Carlo simulations while the current method entails significantly lower computational cost.

    • Author Affiliations


      Sivakumar Bondada1 Soumyendu Raha2 Santanu Mahapatra1

      1. Nano Scale Device Research Laboratory, Centre for Electronics Design and Technology, Indian Institute of Science, Bangalore 560 012
      2. Supercomputer Education and Research Centre, Indian Institute of Science, Bangalore 560 012
    • Dates

  • Sadhana | News

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      Posted on July 25, 2019

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