• Recessed insulator and barrier AlGaN/GaN HEMT: A novel structure for improving DC and RF characteristics

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    • Keywords


      AlGaN/GaN high electron mobility transistor; breakdown voltage; output power density; short channel effect; gate-drain capacitance

    • Abstract


      In this study, a gallium nitride (GaN) high electron mobility transistor (HEMT) with recessed insulator and barrier is reported. In the proposed structure, insulator is recessed into the barrier at the drain side and barrier is recessed into the buffer layer at the source side. We study important device characteristics such as electric field, breakdown voltage, drain current, maximum output power density, gate-drain capacitance, short channel effects and DC transconductance using two-dimensional and two-carrier device simulator. Recessed insulator in the drain side of the proposed structure reduces maximum electric field in the channel and therefore increases the breakdown voltage and maximum output power density compared to the conventional counterpart. Also, gate-drain capacitance value in the proposed structure is less than that of the conventional structure. Overall, the proposed structure reduces short channel effects. Because of the recessed regions at both the source and the drain sides, the average barrier thickness of the proposed structure is not changed. Thus, the drain current of the proposed structure is almost equivalent to that of the conventional transistor. In this work, length (Lr) and thickness (Tr) of the recessed region of the barrier at the source side are the same as those of the insulator at the drain side.

    • Author Affiliations



      1. Department of Electrical Engineering, University of Neyshabur, Neyshabur 9319774400, Iran
      2. Faculty of Engineering, University of Birjand, Birjand 97175/615, Iran
      3. Faculty of Engineering, Ferdowsi University of Mashhad, Mashhad 9319774400, Iran
    • Dates

  • Pramana – Journal of Physics | News

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