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      https://www.ias.ac.in/article/fulltext/pram/083/04/0571-0577

    • Keywords

       

      X-ray diffraction; impedance spectroscopy; electrical conduction; relaxation phenomena.

    • Abstract

       

      The fine (i.e. 38 nm) powder of polycrystalline Na2Mo2O7 was prepared by the hightemperature solid-state reaction technique. The formation of the compound in orthorhombic system is confirmed by preliminary structural analysis using X-ray diffraction (XRD) data. Spectroscopic studies of the compound have been carried out by vibration spectroscopy (Raman/FTIR) to understand its molecular structure at microscopic level. The complex impedance spectroscopy (CIS) technique has been used to study the electrical properties of the material as a function of frequency (102–10$^6$ Hz) at different temperatures (23–450°C), and also to investigate the fundamental mechanism involved in the material. Impedance analysis also indicates that below 300°C, the electrical conduction in the material is due to grain interior only. At and above 325°C, the contribution of grain boundary is clearly evident. The electrical processes in the material are found to be temperature-dependent and are due to the relaxation phenomena in it. A frequency-dependent maximum of the imaginary electrical impedance is found to obey the Vogel–Fulcher law.

    • Author Affiliations

       

      Subrat Kumar Barik1 Sandeep Chatterjee2 R N P Choudhary3

      1. Department of Physics, National Institute of Technology Silchar, Silchar 788 010, India
      2. Jawaharlal Nehru University, New Delhi 110 067, India
      3. Department of Physics, ITER, SOA University, Bhubaneswar 751 030, India
    • Dates

       
  • Pramana – Journal of Physics | News

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