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Measurement of copper vapour laser-induced deformation of dielectric-coated mirror surface by Michelson interferometer
A Wahid S Kundu J S B Singh A K Singh A Khattar S K Maurya J S Dhumal K Dasgupta
Contributed Papers Volume 82 Issue 2 February 2014 pp 445-449
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https://www.ias.ac.in/article/fulltext/pram/082/02/0445-0449 -
Keywords
Michelson interferometer ;interferogram ;high reflectivity mirror ;nanoscale deformation. -
Abstract
AMichelson interferometer-based technique has been used to measure the deformation of dielectric-coated mirror, caused by an incident repetitive pulsed laser beam with high average power. Minimum measurable deformation of 17 nm is reported.
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Author Affiliations
A Wahid1 S Kundu1 J S B Singh1 A K Singh1 A Khattar1 S K Maurya1 J S Dhumal1 K Dasgupta1
- Laser & Plasma Technology Division, Beam Technology Development Group, Bhabha Atomic Research Centre, Mumbai 400 085, India
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Dates
- Published
- February 2014
- Early published
- 14 February 2014
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Pramana – Journal of Physics
Volume 97, 2023
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