• Fulltext


        Click here to view fulltext PDF

      Permanent link:

    • Keywords


      Michelson interferometer; interferogram; high reflectivity mirror; nanoscale deformation.

    • Abstract


      AMichelson interferometer-based technique has been used to measure the deformation of dielectric-coated mirror, caused by an incident repetitive pulsed laser beam with high average power. Minimum measurable deformation of 17 nm is reported.

    • Author Affiliations


      A Wahid1 S Kundu1 J S B Singh1 A K Singh1 A Khattar1 S K Maurya1 J S Dhumal1 K Dasgupta1

      1. Laser & Plasma Technology Division, Beam Technology Development Group, Bhabha Atomic Research Centre, Mumbai 400 085, India
    • Dates

  • Pramana – Journal of Physics | News

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

© 2022-2023 Indian Academy of Sciences, Bengaluru.