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      https://www.ias.ac.in/article/fulltext/pram/082/02/0445-0449

    • Keywords

       

      Michelson interferometer; interferogram; high reflectivity mirror; nanoscale deformation.

    • Abstract

       

      AMichelson interferometer-based technique has been used to measure the deformation of dielectric-coated mirror, caused by an incident repetitive pulsed laser beam with high average power. Minimum measurable deformation of 17 nm is reported.

    • Author Affiliations

       

      A Wahid1 S Kundu1 J S B Singh1 A K Singh1 A Khattar1 S K Maurya1 J S Dhumal1 K Dasgupta1

      1. Laser & Plasma Technology Division, Beam Technology Development Group, Bhabha Atomic Research Centre, Mumbai 400 085, India
    • Dates

       
  • Pramana – Journal of Physics | News

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      Posted on July 25, 2019

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