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      Permanent link:
      https://www.ias.ac.in/article/fulltext/pram/078/03/0405-0416

    • Keywords

       

      Polarization Fourier optics; diffraction of polarized light.

    • Abstract

       

      Polarization property is important to the optical imaging system. It has recently been understood that the polarization properties of light can be fruitfully used for improving the characteristics of imaging system that includes polarizing devices. The vector wave imagery lends an additional degree of freedom that can be utilized for obtaining results that are unobtainable in scalar wave imagery. This calls for a systematic study of diffraction properties of different apertures using polarization-sensitive devices. In the present paper, we have studied the Fraunhofer diffraction pattern of slits masked by different kinds of polarizing devices which introduce a phase difference between the two orthogonal components of the incident beam.

    • Author Affiliations

       

      Mohammad Tahir1 K Bhattacharya2 A K Chakraborty2

      1. Jhikra High School (H.S.), Jhikra, Joypur, Howrah 711 401, India
      2. Department of Applied Optics and Photonics, Calcutta University, 92 Acharya Prafulla Chandra Road, Kolkata 700 009, India
    • Dates

       
  • Pramana – Journal of Physics | News

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      Posted on July 25, 2019

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