• Optical characterization of a-Se$_{85−x}$Te15Zn$_x$ thin ﬁlms

• Fulltext

https://www.ias.ac.in/article/fulltext/pram/078/02/0309-0318

• Keywords

Chalcogenide glasses; thin ﬁlms; optical parameters.

• Abstract

Thin ﬁlms of Se$_{85−x}$Te15Zn$_x$ ($x = 0$, 2, 4, 6 and 10) glassy alloys have been deposited onto a chemically cleaned glass substrate by thermal evaporation technique under vacuum. The analysis of transmission spectra, measured at normal incidence, in the spectral range of 400–2500 nm helped us in the optical characterization of thin ﬁlms under study. From the analysis of transmission spectra, the optical parameters such as refractive index (𝑛), extinction coefﬁcient (𝑘), absorption coefﬁcient (𝛼), real and imaginary dielectric constants ($\epsilon'$ and $\epsilon"$) have been calculated. It is observed that the parameters 𝑛, 𝑘, $\epsilon'$, $\epsilon"$ and 𝛼 decrease with increase in wavelength (𝜆) and increase with Zn content. Optical band gap ($E_g$) has also been calculated and found to decrease with Zn content in Se$_{85−x}$Te15Zn$_x$ glassy system which could be correlated with increase in the density of defect states.

• Author Affiliations

1. Department of Physics, Christ Church College, Kanpur 208 001, India

• Pramana – Journal of Physics

Volume 96, 2022
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Posted on July 25, 2019