• Optical characterization of a-Se$_{85−x}$Te15Zn$_x$ thin films

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      https://www.ias.ac.in/article/fulltext/pram/078/02/0309-0318

    • Keywords

       

      Chalcogenide glasses; thin films; optical parameters.

    • Abstract

       

      Thin films of Se$_{85−x}$Te15Zn$_x$ ($x = 0$, 2, 4, 6 and 10) glassy alloys have been deposited onto a chemically cleaned glass substrate by thermal evaporation technique under vacuum. The analysis of transmission spectra, measured at normal incidence, in the spectral range of 400–2500 nm helped us in the optical characterization of thin films under study. From the analysis of transmission spectra, the optical parameters such as refractive index (𝑛), extinction coefficient (𝑘), absorption coefficient (𝛼), real and imaginary dielectric constants ($\epsilon'$ and $\epsilon"$) have been calculated. It is observed that the parameters 𝑛, 𝑘, $\epsilon'$, $\epsilon"$ and 𝛼 decrease with increase in wavelength (𝜆) and increase with Zn content. Optical band gap ($E_g$) has also been calculated and found to decrease with Zn content in Se$_{85−x}$Te15Zn$_x$ glassy system which could be correlated with increase in the density of defect states.

    • Author Affiliations

       

      S Shukla1 S Kumar1

      1. Department of Physics, Christ Church College, Kanpur 208 001, India
    • Dates

       
  • Pramana – Journal of Physics | News

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