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      Permanent link:
      https://www.ias.ac.in/article/fulltext/pram/075/03/0459-0469

    • Keywords

       

      X-ray attenuation; $^{241}$Am; proton-induced X-ray emission; $K$-edge; thin foils.

    • Abstract

       

      Mass attenuation coefficients ($\mu/\rho$) for Zr, Nb, Mo and Pd elements around their $K$-edges are measured at 14 energies in the range 15.744–28.564 keV using secondary excitation from thin Zr, Nb, Mo, Rh, Pd, Cd and Sn foils. The measurements were carried out at the $K_{\alpha} and $K_{\beta}$ energy values of the target elements by two techniques: (1) Proton-induced X-ray emission (PIXE) and (2) $^{241}$Am (300 mCi) source. In PIXE, 2 MeV proton-excited X-rays were detected by a Si(Li) detector. In the second case, X-rays excited by 59.54 keV photons from the targets were counted by an HPGe detector under a narrow beam good geometry set-up with sufficient shielding. The results are consistent with theoretical values derived from the XCOM package and indicate that the PIXE data have better statistical accuracy.

    • Author Affiliations

       

      K K Abdullah1 K Karunakaran Nair2 N Ramachandran3 K M Varier4 B R S Babu4 Antony Joseph4 Rajive Thomas4 P Magudapathy5 K G M Nair5

      1. Department of Physics, Farook College, Kozhikode 673 632, India
      2. Department of Physics, M.E.S. College, Ponnani 679 586, India
      3. Timmonsville SHS, 304 Timmonsville, South Carolina, USA
      4. Department of Physics, University of Calicut, Malappuram 673 635, India
      5. Particle Irradiation Facility, Material Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India

    • Dates

       
      Published
      September 2010
      Manuscript received
      18 December 2009
      Manuscript revised
      22 April 2010
      Accepted
      22 April 2010

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