Since 1997 we systematically perform direct angle resolved photoemission spectroscopy (ARPES) on in-situ grown thin (< 30 nm) cuprate films. Specifically, we probe low-energy electronic structure and properties of high-𝑇c superconductors (HTSC) under different degrees of epitaxial (compressive vs. tensile) strain. In overdoped and underdoped in-plane compressed (the strain is induced by the choice of substrate) ≃ 15 nm thin La2-𝑥Sr𝑥CuO4 (LSCO) films we almost double 𝑇c to 40 K, from 20 K and 24 K, respectively. Yet the Fermi surface (FS) remains essentially two-dimensional. In contrast, ARPES data under tensile strain exhibit the dispersion that is three-dimensional, yet 𝑇c drastically decreases. It seems that the in-plane compressive strain tends to push the apical oxygen far away from the CuO2 plane, enhances the two-dimensional character of the dispersion and increases 𝑇c, while the tensile strain acts in the opposite direction and the resulting dispersion is three-dimensional. We have established the shape of the FS for both cases, and all our data are consistent with other ongoing studies, like EXAFS. As the actual lattice of cuprates is like a `Napoleon-cake', i.e. rigid CuO2 planes alternating with softer `reservoir', that distort differently under strain, our data rule out all oversimplified two-dimensional (rigid lattice) mean field models. The work is still in progress on optimized La-doped Bi-2201 films with enhanced 𝑇c.
