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    • Keywords


      Crystal spectrometer; X-rays; highly charged ions; electron impact; ionization.

    • Abstract


      We have studied fast ion–atom and electron–atom collision processes using a reconditioned high resolution X-ray spectrometer. The X-rays, generated by the collisions, are dispersed by a curved ADP crystal (Johansson geometry) and detected by a gas proportional counter. A self-written LabVIEW based program has been used to give precise and controlled movement to the crystal and for data acquisition. The performance was tested by detecting the K𝛼 diagram and satellite lines of several elements. The K𝛼 satellite lines of Al have been studied in collision with 3–12 keV electrons and 40 MeV C4+ ions. In ion collisions as large as four L-vacancies are created simultaneously with the K-vacancy, compared to two satellites in case of the e-impact. In addition, we have measured the X-rays from H-, He- and Li-like Si ions which arise due to the electron loss/capture process in highly charged 80 MeV Si7+ ions in collision with thin carbon foil. Approximate charge state distribution has been obtained using this new technique.

    • Author Affiliations


      Ajay Kumar1 D Misra1 A H Kelkar1 U R Kadhane1 K V Thulasiram1 Lokesh C Tribedi1

      1. Tata Institute of Fundamental Research, Colaba, Mumbai 400 005, India
    • Dates

  • Pramana – Journal of Physics | News

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      Posted on July 25, 2019

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