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      Permanent link:
      https://www.ias.ac.in/article/fulltext/pram/060/03/0569-0573

    • Keywords

       

      Compton scattering; Compton profile

    • Abstract

       

      The Compton profile of tantalum (Ta) has been measured using IGP type coaxial photon detector. The target atoms were excited by means of 59.54 keV γ-rays from Am-241. The measurements were carried out on a high purity thin elemental foil. The data were recoreded in a 4 K multichannel analyzer. These data duly corrected for various effects are presented and compared with theoretical and measured values. Best agreement with experiment is found for the 5d36s2 electron configuration

    • Author Affiliations

       

      Thomas Varghese1 K M Balakrishna2 K Siddappa2

      1. Department of Physics, Nirmala College, Muvattupuzha - 686 661, India
      2. Department of Studies in Physics, Mangalore University, Mangalagangotri - 574 199, India
    • Dates

       
  • Pramana – Journal of Physics | News

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      Posted on July 25, 2019

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