• An apparatus for the measurement of thermal expansion of solids at low temperatures

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      https://www.ias.ac.in/article/fulltext/pram/039/06/0655-0660

    • Keywords

       

      Thermal expansion; high temperature superconductors; critical temperature; three terminal capacitance technique; mounting corrections

    • Abstract

       

      A dilatometer, using the three terminal capacitance technique, suitable for measurement of linear thermal expansion of solids in the temperature range 1.3–300 K is described. The dialtometer is designed such that the mounting system for the specimen does not undergo any significant changes in dimensions when the specimen is heated. The apparatus, therefore, yields in principle absolute values of α, the coefficient of linear thermal expansion. The performance of the apparatus has been checked by measurements on copper in the temperature range of 77–300 K. Some preliminary results on the behaviour of α for Y1Ba2Cu3O6.9 compound in the vicinity of superconducting transition temperature,Tc are also described. The system can detect relative changes in length Δl/l0 of about 10−8. Attempts are being made to improve the sensitivity.

    • Author Affiliations

       

      Om Prakash1 Ashok Rao1 P N Dheer1

      1. Department of Physics and Astrophysics, University of Delhi, Delhi - 110 007, India
    • Dates

       
  • Pramana – Journal of Physics | News

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