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      https://www.ias.ac.in/article/fulltext/pram/037/05/0431-0436

    • Keywords

       

      Triafol-TN; chemical etching; activation energy; track length; response curve

    • Abstract

       

      Triafol-TN plastic detector foils have been irradiated with238U ions of energy 16.34 MeV/u and the tracks produced have been observed using the chemical etching technique. The bulk etch rate and track etch rate are determined under successive chemical etching. In our case, the validity of Arrhenius’s law is confirmed by the fact that the same value ofEa obtained for these different concentrations, within experimental errors. The results show a linear correlation between the measured track etch rate along the track and the corresponding total energy loss rate and a threshold value of ∼ 5.0 MeV/(mg/cm2) for track registration was obtained. The maximum etched track length of238U-ion in triafol-TN has been compared with the theoretically computed range.

    • Author Affiliations

       

      R K Jain1 S K Bose1 K K Dwivedi1 2

      1. Department of Physics, Banaras Hindu University, Varanasi - 221 005, India
      2. Chemistry Department, North Eastern Hill University, Shillong - 793 001, India
    • Dates

       
  • Pramana – Journal of Physics | News

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