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      Permanent link:
      https://www.ias.ac.in/article/fulltext/pram/033/05/0541-0546

    • Keywords

       

      Microprocessor based instrumentation; electromigration; tin thin films

    • Abstract

       

      Mass transport due to electromigration can be estimated if the diffusion coefficientD and the electromigration effective charge numberZ* are known. Neutron activated tracer scanning method determine the radioactivity at different positions. An automatic scanning system for determining the radioactive concentration profiles developed using a microprocessor is described in this paper. Using the radioactive concentration profiles the electromigration shift is determined. From this shift the electromigration effective charge numberZ* is calculated. The system developed was tested for tin thin films.

    • Author Affiliations

       

      M Dhanabalan1 Y Syamasundara Rao1 K V Reddy1

      1. Department of Physics, Indian Institute of Technology, Madras - 600 036, India
    • Dates

       
  • Pramana – Journal of Physics | News

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