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    • Keywords


      Microprocessor based instrumentation; electromigration; tin thin films

    • Abstract


      Mass transport due to electromigration can be estimated if the diffusion coefficientD and the electromigration effective charge numberZ* are known. Neutron activated tracer scanning method determine the radioactivity at different positions. An automatic scanning system for determining the radioactive concentration profiles developed using a microprocessor is described in this paper. Using the radioactive concentration profiles the electromigration shift is determined. From this shift the electromigration effective charge numberZ* is calculated. The system developed was tested for tin thin films.

    • Author Affiliations


      M Dhanabalan1 Y Syamasundara Rao1 K V Reddy1

      1. Department of Physics, Indian Institute of Technology, Madras - 600 036, India
    • Dates

  • Pramana – Journal of Physics | News

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      Posted on July 25, 2019

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