1. Home
    2. Journals
    3. Pramana – Journal of Physics
    4. Volume 31
    5. Issue 3

    • Fulltext

       

        Click here to view fulltext PDF


      Permanent link:
      https://www.ias.ac.in/article/fulltext/pram/031/03/0197-0203

    • Keywords

       

      Activation energy; critical energy-loss rate; Lexan; track-etch rate; track length

    • Abstract

       

      Latent damage tracks of energetic40Ar ions (18·56 MeV/u) have been recorded in Lexan polycarbonate detector. Bulk and track-etch parameters are evaluated under successive chemical etching. Our results show a linear correlation between the measured track-etch rate along the track and the corresponding total energy-loss rate and predict a threshold value of 5·0 MeV mg−1 cm2 for track registration. Maximum etchable track lengths of40Ar ions as a function of energies have also been measured and compared with three different sets of theoretical ranges.

    • Author Affiliations

       

      Swarnali Ghosh1 Atul Saxena1 K K Dwivedi1

      1. Department of Chemistry, North-Eastern Hill University, Shillong - 793 003, India

    • Dates

       
      Published
      September 1988
      Manuscript received
      8 February 1988
      Manuscript revised
      31 May 1988

  • Pramana – Journal of Physics | News

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

© 2022-2023 Indian Academy of Sciences, Bengaluru.

Contact | Site index