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      Permanent link:
      https://www.ias.ac.in/article/fulltext/pram/031/03/0197-0203

    • Keywords

       

      Activation energy; critical energy-loss rate; Lexan; track-etch rate; track length

    • Abstract

       

      Latent damage tracks of energetic40Ar ions (18·56 MeV/u) have been recorded in Lexan polycarbonate detector. Bulk and track-etch parameters are evaluated under successive chemical etching. Our results show a linear correlation between the measured track-etch rate along the track and the corresponding total energy-loss rate and predict a threshold value of 5·0 MeV mg−1 cm2 for track registration. Maximum etchable track lengths of40Ar ions as a function of energies have also been measured and compared with three different sets of theoretical ranges.

    • Author Affiliations

       

      Swarnali Ghosh1 Atul Saxena1 K K Dwivedi1

      1. Department of Chemistry, North-Eastern Hill University, Shillong - 793 003, India
    • Dates

       
  • Pramana – Journal of Physics | News

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      Posted on July 25, 2019

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