Tracks of 18·56 MeV/u40Ar ions in Lexan polycarbonate detector
Swarnali Ghosh Atul Saxena K K Dwivedi
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Latent damage tracks of energetic40Ar ions (18·56 MeV/u) have been recorded in Lexan polycarbonate detector. Bulk and track-etch parameters are evaluated under successive chemical etching. Our results show a linear correlation between the measured track-etch rate along the track and the corresponding total energy-loss rate and predict a threshold value of 5·0 MeV mg−1 cm2 for track registration. Maximum etchable track lengths of40Ar ions as a function of energies have also been measured and compared with three different sets of theoretical ranges.
Swarnali Ghosh1 Atul Saxena1 K K Dwivedi1
Volume 97, 2023
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