Development of high resolution silicon surface barrier detectors
Fabrication methods for silicon surface barrier detectors and their correlated properties which result in the production of high resolution (< 20 keV) devices have been studied. The techniques for fabrication and testing of the detectors currently employed at our Centre are presented. An FWHM of 14keV for 5·486 MeV241Am α has been achieved. Our results are therefore comparable with the best in the world.
Volume 93 | Issue 5
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