Development of high resolution silicon surface barrier detectors
Fabrication methods for silicon surface barrier detectors and their correlated properties which result in the production of high resolution (< 20 keV) devices have been studied. The techniques for fabrication and testing of the detectors currently employed at our Centre are presented. An FWHM of 14keV for 5·486 MeV241Am α has been achieved. Our results are therefore comparable with the best in the world.
Volume 94, 2020
Continuous Article Publishing mode
Click here for Editorial Note on CAP Mode