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      Permanent link:
      https://www.ias.ac.in/article/fulltext/pram/019/04/0381-0384

    • Keywords

       

      X-ray diffraction; thermal expansion; silver indium disulphide

    • Abstract

       

      Lattice parameters of chalcopyrite type compound silver indium disulphide (AgInS2) were determined as a function of temperature by the x-ray method in the temperature range 28 to 685°C. Using these data, the coefficients of thermal expansion,a⊥ anda‖, were evaluated by a graphical method. The temperature dependence ofa⊥ anda‖ is represented by a suitable equation. The anisotropic thermal expansion of AgInS2 is explained in terms of the thermal expansion of the Ag-S and In-S bonds of the AgInS2 lattice.

    • Author Affiliations

       

      P Kistaiah1 K Satyanarayana Murthy1 K V Krishna Rao1 2

      1. Department of Physics, University College of Science, Osmania University, Hyderabad - 500 007, India
      2. Department de Physique, Institute des Exactes Sciences, Universite de constantine, Constantine, Algeria

    • Dates

       
      Published
      October 1982
      Manuscript received
      15 April 1982
      Manuscript revised
      5 July 1982

  • Pramana – Journal of Physics | News

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      Posted on July 25, 2019

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