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X-ray diffraction; thermal expansion; silver indium disulphide

Lattice parameters of chalcopyrite type compound silver indium disulphide (AgInS₂) were determined as a function of temperature by the x-ray method in the temperature range 28 to 685°C. Using these data, the coefficients of thermal expansion,a_⊥ anda_‖, were evaluated by a graphical method. The temperature dependence ofa_⊥ anda_‖ is represented by a suitable equation. The anisotropic thermal expansion of AgInS₂ is explained in terms of the thermal expansion of the Ag-S and In-S bonds of the AgInS₂ lattice.

P Kistaiah¹ K Satyanarayana Murthy¹ K V Krishna Rao^{1 2}

1. Department of Physics, University College of Science, Osmania University, Hyderabad - 500 007, India
2. Department de Physique, Institute des Exactes Sciences, Universite de constantine, Constantine, Algeria

Published

October 1982

Manuscript received

15 April 1982

Manuscript revised

5 July 1982